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Steady state heat reflection thermal conductivity meter SSTR-F
Steady state heat reflection thermal conductivity meter SSTR-F
Product details
■ Product Description
The steady-state thermal reflection testing method combines laser thermal reflection techniques (TDTR, FDTR) with steady-state thermal conduction techniques to perform rapid and small-scale steady-state measurements.
The wide range of thermal conductivity testing ranges from 0.05W/mK to 2500W/mK, and SSTR-F can even test samples as small as a few hundred micrometers. The system provides convenient use through fiber optic components and lasers, and the optional FDTR measurement module measures radial and lateral thermal conductivity, as well as material boundary thermal impedance. Paired with an automatic platform, a 100mm heat conduction distribution map can be achieved.
The steady-state thermal reflection testing method combines laser thermal reflection techniques (TDTR, FDTR) with steady-state thermal conduction techniques to perform rapid and small-scale steady-state measurements.
The wide range of thermal conductivity testing ranges from 0.05W/mK to 2500W/mK, and SSTR-F can even test samples as small as a few hundred micrometers. The system provides convenient use through fiber optic components and lasers, and the optional FDTR measurement module measures radial and lateral thermal conductivity, as well as material boundary thermal impedance. Paired with an automatic platform, a 100mm heat conduction distribution map can be achieved.
SSTR-F was developed by Professor Patrick Hopkins from the ExSiTE Laboratory at the University of Virginia.
For paper reference: A steady-state thermoreflectance method to measure thermal conductivity - Review of Scientific Instruments 90, 024905 (2019); https://doi.org/10.1063/1.5056182
| Solid and liquid | |
| Thermal conduction range | 0.05 to 2500W/mk |
|---|---|
| Hot spot size | >100um |
| temperature range | 80K to 600K |
| **Degree | 5% |
| reproducibility | 2% |
| FDTR | |
| Thermal conduction range | 0.05 to 2500W/mk |
| Measurement direction | Thickness direction, plane direction |
| film thickness | >5nm |
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